PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

1 Department of Computer and Instructional Technologies Education, Gazi Faculty of Education, Gazi University, Ankara, Türkiye. 2 Department of Forensic Informatics, Institute of Informatics, Gazi ...

AI tools are frequently used in data visualization — this article describes how they can make data preparation more efficient ...

Abstract: In semiconductor manufacturing, virtual metrology (VM) leverages high-dimensional sensor data for real-time quality estimation. However, excessive sensor deployment leads to increased ...

Docker is a widely used developer tool that first simplifies the assembly of an application stack (docker build), then allows ...

Gigasoft releases ProEssentials v10 with GPU compute shaders and publishes six-part WPF chart library comparison for ...

Abstract: Robust tensor principal component analysis (RTPCA) based on tensor singular value decomposition (t-SVD) separates the low-rank component and the sparse component from the multiway data. For ...

ABSTRACT: The role of effective procurement management in enhancing project performance is crucial, particularly within the context of Lusaka Water and Sanitation Company (LWSC). Despite the ...

Computation of training set (X^T * W * X) and (X^T * W * Y) or (X^T * X) and (X^T * Y) in a cross-validation setting using the fast algorithms by Engstrøm and Jensen (2025). FELBuilder is an automated ...

While working on a research paper, I decided to test one of the leading AI assistants and asked Anthropic’s Claude to analyze hundreds of emails and build a spreadsheet of recent Nobel Prize-winners.