At IRPS 2026, the premier forum for new and original research in microelectronics reliability, CEA‑Leti will present seven papers that reflect a broad and integrated expertise across device physics, ...
Semiconductor aging refers to the slow loss of electrical characteristics of the semiconductor device as a result of continuous use or prolonged exposure to various environmental conditions like ...
A new technical paper titled “Thermo-mechanical co-design of 2.5D flip-chip packages with silicon and glass interposers via finite element analysis and machine learning” was published by researchers ...
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