As process technologies continue to shrink and memory size and design complexity grow, it has become increasingly difficult to achieve high manufacturing yield. Embedded memories are the most dense ...
Two companies have joined forces to optimize quality, integrity, post-programming validation, and cost for embedded test of reprogrammable logic cores. The increasing complexity of system-on-a-chip ...
Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...
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