Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
EDN

ST adopts Synopsys’ ATPG tool

PARIS — Synopsys Inc. announced that STMicroelectronics NV has selected Synopsys' TetraMAX small delay defect (SDD) automatic test pattern generation (ATPG) and failure diagnostics solution in order ...
Electronic Design

ATPG Tool Delivers Design-For-Test Solution

In its latest version, FastScan 2001 automatic test pattern generation (ATPG) tool reportedly can reduce test pattern sizes by as much as 60%. It can also test small embedded memories and other macros ...
Semiconductor Engineering

Can Your ATPG Do This? Cut Defects Escaping Detection With ML

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
EDN

SILICON PROCESSING: Test diagnostic tool helps to increase yields

Santa Cruz, Calif. — Pity the IC failure analysis expert. While scan test data provides a starting point for diagnosis, isolating fault locations and identifying defect types is tough. Mentor Graphics ...